Title :
Ultra thin electronics for space applications
Author :
Vendier, O. ; Huan, M. ; Drevofi, C. ; Cazaux, J.L. ; Beyne, E. ; Van Hoof, R. ; Marty, A. ; Pinel, S. ; Tasselli, J. ; Marco, S. ; Morante, JR
Author_Institution :
Alcatel Espace, Toulouse, France
Abstract :
Higher performance, increasing I/O requirements and smaller chip size are putting more demands on technology for increased density. If most of the demand is coming from consumer electronics for next generation of Internet portable devices, similar trends are seen in the space industry with the future generation of broadband multimedia satellite payloads. A new patented packaging technology for highly complex digital application is presented in this paper. 3D interconnect of ultra-thin silicon die (15 μm thick) is enabled through slightly modified MCM-D technology. Collective fabrication is done with specifications which could respond to space environment standards. We review the key enabling technologies used to fabricate an ultra compact channelizer composed of 3 cascaded, 496 I/O ASICs. The 3D module has a footprint of 25×25 mm2 with overall thickness of 500 μm which makes it compatible of any chip scale package that will allow thermal management for 7.8 W power dissipation
Keywords :
integrated circuit interconnections; multichip modules; space vehicle electronics; thermal analysis; thermal management (packaging); 15 micron; 3D interconnect; 3D module; 500 micron; 7.8 W; Si; cascaded ASICs; chip scale package; complex digital application; fabrication; modified MCM-D technology; packaging technology; space applications; space environment standards; thermal management; ultra compact channelizer; ultra thin electronics; ultra-dense stacking technology; ultra-thin Si die; Aerospace industry; Consumer electronics; Electronics industry; Electronics packaging; Internet; Multimedia systems; Payloads; Satellites; Space technology; Thermal management;
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7038-4
DOI :
10.1109/ECTC.2001.927865