Title :
Fabrication of flat electrodes with nano-gaps using cluster ion beams
Author :
Taniguchi, M. ; Kawai, T. ; Watanabe, K. ; Matsui, S. ; Toyoda, Noriaki ; Yamada, I. ; Kubota, T. ; Mashik, S.
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ., Ibaraki, Japan
Abstract :
Recently there has been of considerable interest in developing molecular electronic devices by utilizing the ability of self-assembly to form a fixed structure. In order to evaluate electronic properties of molecular devices, it is required to make flat electrodes in which the surface of electrodes is almost parallel to that of insulating substrate, since steps between electrodes and substrates prevent from constructing a self-assembly nanostructure. We herein report fabrication processes of flat electrodes whose spacing are about 100 nm, using electron beam lithography and argon gas-cluster ion beams.
Keywords :
electrodes; electron beam lithography; ionised cluster beam deposition; molecular electronics; nanocontacts; nanolithography; 100 nm; cluster ion beams; electron beam lithography; electronic properties; flat electrodes fabrication; molecular electronic devices; nano-gaps; self-assembly; Argon; Electrodes; Electron beams; Fabrication; Insulation; Ion beams; Lithography; Molecular electronics; Nanoscale devices; Self-assembly;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-031-3
DOI :
10.1109/IMNC.2002.1178589