DocumentCode :
3165583
Title :
MOS-IC Process And Device Characterization Within Philips
Author :
Swaving, Sieger ; Ketting, Alfred ; Trip, Albert
Author_Institution :
PHILIPS Research Laboratories
fYear :
1988
fDate :
22-23 Feb. 1988
Firstpage :
180
Lastpage :
184
Keywords :
Automatic testing; Bonding; Integrated circuit testing; Laboratories; Libraries; Phase change materials; Process control; Production; Research and development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
Type :
conf
DOI :
10.1109/ICMTS.1988.672957
Filename :
672957
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3165583
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