Title :
Novel Instability-Probing Simulation for Power Amplifiers
Author :
Mizuno, Shinya ; Naito, Kohei ; Tateno, Yasunori ; Sano, Seigo ; Tokumitsu, Tsuneo
Author_Institution :
Eudyna Devices Inc., Yamanashi
Abstract :
A novel instability-probing simulation for power amplifiers is presented. Instabilities of power amplifiers with use of very-high performance pHEMT should be observed from a single-gate pHEMT among the multi-gate configuration of the pHEMT, where the power amplifiers are not yet symmetric. A conventional orthogonal (even- and odd-) mode analysis, based on the symmetric power combining, is not complete to predict various instabilities in the power amplifiers. This paper demonstrates a novel instability-probing simulation method that incorporates an ideal transformer. The proposed method successfully predicted microwave and millimeter-wave spurious oscillations observed for a Ku-band MMIC power amplifier
Keywords :
HEMT integrated circuits; MMIC power amplifiers; Ku-band; MMIC power amplifier; high electron mobility transistors; instability probing; orthogonal mode analysis; power combining; Circuits; Impedance; MMICs; Microwave amplifiers; Microwave devices; Microwave theory and techniques; PHEMTs; Power amplifiers; Radio frequency; Reflection; multi-gate pHEMT; power amplifiers; probing; spurious oscillation;
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
DOI :
10.1109/EUMC.2006.281231
