DocumentCode
316591
Title
High Field Breakdown Characteristics of Micrometric Gaps in Vacuum
Author
Ma, Xianyun ; Kim, J.D. ; Sudarshan, T.S.
Author_Institution
Electrical and Computer Engineering Department, University of South Carolina
fYear
1997
fDate
17-21 Aug. 1997
Firstpage
725
Lastpage
729
Keywords
Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Flat panel displays; System testing; Temperature; Vacuum breakdown; Vacuum systems; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-3786-7
Type
conf
DOI
10.1109/IVMC.1997.627685
Filename
627685
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