Title :
Built-in current testing versus delay fault testing-a case study
Author :
Hübner, U. ; Vierhaus, H.T.
Author_Institution :
GMD/SET, St. Augustin, Germany
Abstract :
Descriptions are given of the most significant types of defects and their implication on delay effects and overcurrents for different classes of CMOS circuits. Delay fault testing and built-in current testing have emerged as the most promising methods in CMOS testing for high fault coverage. Based on different types of transistor circuits, an analysis is performed to investigate the fault coverage potential of both methods for transistor faults and bridging faults.<>
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit testing; CMOS circuits; CMOS testing; bridging faults; built-in current testing; delay effects; fault coverage potential; fault testing; high fault coverage; transistor circuits; transistor faults; Bridge circuits; Circuit faults; Circuit testing; Computer aided software engineering; Delay effects; Electrical fault detection; Fault detection; Switches; Transistors; Voltage;
Conference_Titel :
CompEuro '92 . 'Computer Systems and Software Engineering',Proceedings.
Conference_Location :
The Hague, Netherlands
Print_ISBN :
0-8186-2760-3
DOI :
10.1109/CMPEUR.1992.218498
