• DocumentCode
    3166901
  • Title

    Fracture behaviour of flip chip solder joints

  • Author

    Wiese, Steffen ; Jakschik, Stefan ; Feustel, Frank ; Meusel, Ekkehard

  • Author_Institution
    Semicond. & Microsyst. Technol. Lab., Tech. Univ. Dresden, Germany
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1299
  • Lastpage
    1306
  • Abstract
    The paper presents the results of isothermal cyclic shear experiments on flip chip solder joints. Two micro shear testers have been designed and built for this task. One tester is optimised to achieve high precision. Since it is actively compensated for its finite stiffness, this tester is able to record force displacement hysteresis with a resolution of better than 1 mN and 20 nm force and displacement measurements, respectively. The second tester works very similar but fits in a UHV chamber. This way, it enables in-situ SEM observations during the test. The experiments were done exactly the same way with both machines. The experimental program consisted on two types of isothermal experiments. The first type used a cyclic triangular strain wave with constant frequency but different amplitudes as the load function. The second type used a cyclic triangular strain wave with constant amplitude but different frequencies as the load function. The strain wave amplitudes ranged from Δε=0.3%…4%, the strain wave frequencies ranged from f=0,0004 Hz … 10 Hz. The test temperature was 300 K. The investigated solder materials have been Sn63Pb37 and Sn95.5Ag4Cu0.5. In order to model crack propagation in FEM simulations, two different criteria have been tested, to develop a simple crack propagation model. The first criterion was plastic strain energy ΔWpl and the second criterion was accumulated inelastic strain εacc. The paper gives crack propagation relations for both criteria
  • Keywords
    ductile fracture; finite element analysis; flip-chip devices; integrated circuit packaging; plastic deformation; scanning electron microscopy; shear deformation; soldering; thermal management (packaging); thermal stress cracking; FEM simulations; SnAgCu; SnPb; accumulated inelastic strain; crack propagation model; cyclic triangular strain wave; flip chip solder joints; force displacement hysteresis; fracture behaviour; high precision; in-situ SEM; isothermal cyclic shear; micro shear testers; package reliability; plastic strain energy; thermomechanical stress; ultrahigh vacuum chamber; Capacitive sensors; Displacement measurement; Flip chip solder joints; Force measurement; Frequency; Hysteresis; Isothermal processes; Materials testing; Numerical analysis; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927998
  • Filename
    927998