Title :
Fast Modeling and Optimization of Active Millimeter Wave Imaging Systems
Author :
Ocket, I. ; Nauwelaers, B. ; Koers, G. ; Stiens, J.
Author_Institution :
Div. ESAT/Telemic, K.U. Leuven, Heverlee
Abstract :
This paper presents a simplified 2D calculation method based on Huygens´ principle for active millimeter wave imaging systems. Although limited in its ability to accurately treat 3D systems, the method is a powerful tool for first order system optimization. We show in this paper how image aberrations such as speckle and glint can be studied and how image enh ancing techniques can be studied with very little computational resources
Keywords :
aberrations; image enhancement; method of moments; millimetre wave imaging; speckle; Huygens principle; active millimeter wave imaging systems; first order system optimization; glint; image aberrations; image enhancement; method of moments; speckle; Frequency estimation; Geometry; Lenses; Microwave imaging; Millimeter wave technology; Optical imaging; Optical reflection; Optimization methods; Shape; Speckle; Active millimeter wave imaging; Hadamard; Huygens; method of moments; speckle;
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
DOI :
10.1109/EUMC.2006.281378
