DocumentCode :
3167399
Title :
Research on detection and correction of defective pixels of LASIS
Author :
Juanjuan Jing ; Qunbo Lv ; Dalian Shi
Author_Institution :
Acad. of Opto-Electron., Beijing, China
fYear :
2013
fDate :
22-23 Oct. 2013
Firstpage :
7
Lastpage :
10
Abstract :
Due to the imperfections in producing, a finite number of pixels in an array will be defective. Regarding a Fourier transform Imaging spectrometer, the existence of defective pixels will not only affect the quality of the image, but also cause interferogram extraction error, and then result in a distortion of the reconstructed spectrum. So the defective pixels must be accurately distinguished and eliminated by data processing. In this paper, according to the characteristic of the Fourier transform Imaging spectrometer, a distinguishing and eliminating method is carried out. The Fourier transform Imaging spectrometer is illuminated by a uniform light. The data is fitted in the spatial dimension; the error between the actual data and the fitted data is computed and divided by the standard deviation. By choosing a proper threshold value, the cold, hot and non-saturated pixels can be effectively distinguished. Single defective pixels can be effectively corrected by spatial dimension interpolating; for clustered defective pixels, spatial dimension interpolating and interference dimension fitting are taken and the result is averaged. The experimental result proves that this method is effective and also efficient both for uniform light illuminated data and push broom data.
Keywords :
Fourier transform spectrometers; distortion; image restoration; interpolation; pattern clustering; spectral analysis; Fourier transform imaging spectrometer; LASIS; data processing; defective pixel clustering; defective pixel correction; defective pixel detection; image quality; interference dimension fitting; interferogram extraction error; large aperture static interference spectral imager; push broom data; reconstructed spectrum distortion; single defective pixels; spatial dimension interpolating; standard deviation; uniform light illuminated data; Charge coupled devices; Fitting; Fourier transforms; Imaging; Interference; Interpolation; Standards; Defective pixels; Fourier transform Imaging spectrometer; data fitting; interferogram; interpolating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Imaging Systems and Techniques (IST), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5790-6
Type :
conf
DOI :
10.1109/IST.2013.6729652
Filename :
6729652
Link To Document :
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