Design of compact and high speed totally self-checking CMOS checkers for m-out-of-n codes

This paper presents a novel method for designing TSC m-out-of-n code checkers taking into account a realistic fault model including stuck-at, transistor stuck-on, transistor stuck-open, resistive bridging faults and breaks. The proposed design method is the first method in the open literature that takes into account a realistic fault model and can be applied for all practical values of m and n. Apart from the above the proposed checkers are very compact and very fast. Another benefit of the proposed TSC checkers is that all faults are tested by single pattern tests thus the probability of achieving the TSC goal is greater than in checkers requiring two-pattern tests