• DocumentCode
    316792
  • Title

    Exploiting high-level descriptions for circuits fault tolerance assessments

  • Author

    Benso, A. ; Prinetto, P. ; Rebandengo, M. ; Reorda, M. Soma ; Raik, J. ; Ubar, R.

  • Author_Institution
    Politecnico di Torino, Italy
  • fYear
    1997
  • fDate
    20-22 Oct 1997
  • Firstpage
    212
  • Lastpage
    216
  • Abstract
    The paper proposes a new approach to estimate early the fault detection capability of a safety-critical computer-based system from its high-level description. This paper first aims at verifying the correspondence between dependability measures obtained through simulation-based fault injection experiments at different levels of abstraction. Then, we propose Alternative Graphs (AGs) to create lists of malicious faults without expanding the full data flow, whose size can often explode. Fault trees are exploited to improve the results of the high-level fault analysis. To evaluate the effectiveness of the approach, simulation-based fault injection experiments have been done on some benchmark systems described in VHDL language. The approach demonstrates that fault detection analysis performed at a high-level is less CPU time demanding but approximates well the fault detection measures achievable on a low-level system description
  • Keywords
    computer testing; fault diagnosis; fault trees; graph theory; logic testing; VHDL language description; alternative graphs; circuit fault tolerance assessment; dependability measures; fault detection analysis; fault detection capability; fault trees; high-level descriptions; high-level fault analysis; safety-critical computer-based system; simulation-based fault injection experiments; Circuit faults; Circuit simulation; Computational modeling; Electrical fault detection; Fault detection; Fault tolerance; Fault trees; Flow graphs; Performance analysis; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
  • Conference_Location
    Paris
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-8168-3
  • Type

    conf

  • DOI
    10.1109/DFTVS.1997.628327
  • Filename
    628327