Title :
Exploiting high-level descriptions for circuits fault tolerance assessments
Author :
Benso, A. ; Prinetto, P. ; Rebandengo, M. ; Reorda, M. Soma ; Raik, J. ; Ubar, R.
Author_Institution :
Politecnico di Torino, Italy
Abstract :
The paper proposes a new approach to estimate early the fault detection capability of a safety-critical computer-based system from its high-level description. This paper first aims at verifying the correspondence between dependability measures obtained through simulation-based fault injection experiments at different levels of abstraction. Then, we propose Alternative Graphs (AGs) to create lists of malicious faults without expanding the full data flow, whose size can often explode. Fault trees are exploited to improve the results of the high-level fault analysis. To evaluate the effectiveness of the approach, simulation-based fault injection experiments have been done on some benchmark systems described in VHDL language. The approach demonstrates that fault detection analysis performed at a high-level is less CPU time demanding but approximates well the fault detection measures achievable on a low-level system description
Keywords :
computer testing; fault diagnosis; fault trees; graph theory; logic testing; VHDL language description; alternative graphs; circuit fault tolerance assessment; dependability measures; fault detection analysis; fault detection capability; fault trees; high-level descriptions; high-level fault analysis; safety-critical computer-based system; simulation-based fault injection experiments; Circuit faults; Circuit simulation; Computational modeling; Electrical fault detection; Fault detection; Fault tolerance; Fault trees; Flow graphs; Performance analysis; Performance evaluation;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628327