DocumentCode :
3168236
Title :
Liquid delivery CVD of PLZT thick films for electro-optic applications
Author :
Roeder, J.F. ; Bilodeau, S.M. ; Van Buskirk, P.C. ; Ozguz, V.H. ; Ma, J. ; Lee, S.H.
Author_Institution :
Adv. Technol. Mater., Danbury, CT, USA
fYear :
1991
fDate :
33457
Firstpage :
687
Lastpage :
690
Abstract :
PLZT films in the composition range 7/0/100-32/0/100 have been deposited by CVD from a single source reagent using a liquid delivery/flash vaporization approach. Single phase perovskite films ranging in thickness from 1-5 μm were deposited on fused silica substrates at 535°C. The films had very strong crystallographic texture with [100] normal to the plane of the film. Optical loss per unit thickness was lower for thicker films suggesting that interfacial effects dominated losses. Very large electro-optic effects were observed in a number of the films. Birefringent shifts were measured by phase retardation in transmission mode with an electric field applied in the plane of the film using interdigitated electrodes. Birefringent shift varied quadratically with applied field and showed little hysteresis with R coefficients as high as 5×10-16 (m/V)2. The strength of the electro-optic effect is attributed to the high degree of crystallinity of the films and the a-axis orientation
Keywords :
CVD coatings; birefringence; dielectric hysteresis; ferroelectric materials; ferroelectric thin films; interface phenomena; lanthanum compounds; lead compounds; optical losses; piezoceramics; texture; 1 to 5 mum; 535 C; PLZT; PLZT thick films; PbLaZrO3TiO3; a-axis orientation; birefringent shift; electro-optic applications; fused silica substrates; high degree of crystallinity; liquid delivery CVD; liquid delivery/flash vaporization approach; optical loss per unit thickness; single phase perovskite films; single source reagent; transmission mode; very large electro-optic effects; very strong crystallographic texture; Birefringence; Crystallography; Electric variables measurement; Electrodes; Optical films; Optical losses; Phase measurement; Silicon compounds; Substrates; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
Type :
conf
DOI :
10.1109/ISAF.1994.522461
Filename :
522461
Link To Document :
بازگشت