Title :
Experience of developing and using CAD tools for III-V FETs effectively in a nonideal world
Author :
Webster, D.R. ; Parker, A.E. ; Hutabarat, M. ; Ataei, G.R. ; Haigh, D.G. ; Radmore, P.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK
Abstract :
This paper describes the experience gained in developing and using CAD tools for the design of low distortion and nonlinear FET circuits using III-V technology. It includes a description of the CAD packages used, key features required in the CAD packages for realistic simulation, techniques for small and large signal “quick look” assessment for choosing bias and load and some example circuits where the tools have been used successfully
Keywords :
circuit CAD; CAD packages; CAD tools; III-V MESFETs; MMIC; bias; circuit simulation; large signal analysis; load; low distortion circuits; nonlinear FET circuits; small signal analysis;
Conference_Titel :
Effective Microwave CAD Tools (Ref. No. 1999/064), IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19990377
