• DocumentCode
    3169986
  • Title

    Combined procedure with randomized controls for the parameters´ confidence region of linear plant under external arbitrary noise

  • Author

    Amelin, Konstantin ; Amelina, Natalia ; Granichin, Oleg ; Granichina, Olga

  • Author_Institution
    Dept. of Math. & Mech., St. Petersburg State Univ., St. Petersburg, Russia
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Firstpage
    2134
  • Lastpage
    2139
  • Abstract
    The new algorithm is proposed for the estimating of linear plant´s unknown parameters in the case of observations with arbitrary external noises. It is based on adding of randomized inputs (test perturbations) through the feedback channel. The assumptions about the noise are reduced to a minimum: it can virtually be arbitrary but independently of it the user must be able to add test perturbations. We combine the previous result about asymptotic properties of randomized control strategy with the new one which is followed by a non-asymptotic approach of LSCR (Leave-out Sign-dominant Correlation Regions) method. The new algorithm gives confidence regions for series of finite sets of observations. These regions shrink to the true values of an unknown parameters when number of observations tents to infinity while the algorithm complexity does not increases.
  • Keywords
    computational complexity; feedback; linear systems; parameter estimation; perturbation techniques; randomised algorithms; LSCR; algorithm complexity; arbitrary external noise; asymptotic properties; external arbitrary noise; feedback channel; finite set; leave-out sign-dominant correlation region method; linear plant; nonasymptotic approach; parameter confidence region; parameter estimation; randomized control strategy; randomized input; test perturbation; Approximation algorithms; Autoregressive processes; Equations; Estimation; Mathematical model; Noise; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control (CDC), 2012 IEEE 51st Annual Conference on
  • Conference_Location
    Maui, HI
  • ISSN
    0743-1546
  • Print_ISBN
    978-1-4673-2065-8
  • Electronic_ISBN
    0743-1546
  • Type

    conf

  • DOI
    10.1109/CDC.2012.6426338
  • Filename
    6426338