Measurement of output phase relationships of multimode interference splitters using a shearing-type near-field Sagnac interferometer

Author

Kareenahalli, S. ; Saini, S. ; Dagenais, M. ; Tayag, T.J. ; Euliss, G. ; Stone, D.

Author_Institution

Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA

Volume

1

fYear

1997

fDate

10-13 Nov 1997

Firstpage

401

Abstract

Multimode interference (MMI) devices, based on the self-imaging effect, exhibit low excess loss, ultra-compact size, wavelength and polarization insensitivity. These desirable characteristics make MMI splitters/combiners very attractive for wavelength division multiplexing (WDM) applications. A complete study of the phase behavior of MMI devices has to be undertaken to investigate the use of these devices in optical interference based WDM applications. A comprehensive theoretical analysis of phase relations for a general N×N MMI coupler has been reported by M. Bachmann et al.{ see, Appl. Opt., vol. 33, p. 3905, 1994}. Here, we report the experimental measurement of the output phase relationships of AlGaAs-GaAs MMI waveguide splitters, using a ring interferometer

Keywords

III-V semiconductors; aluminium compounds; gallium arsenide; integrated optics; light interferometry; optical communication equipment; optical testing; optical waveguides; semiconductor device testing; wavelength division multiplexing; AlGaAs-GaAs; AlGaAs-GaAs MMI waveguide splitters; MMI coupler; MMI splitters/combiners; WDM; light interferometry; low excess loss; multimode interference splitters; optical interference based WDM applications; output phase relationships; phase behavior; phase relations; polarization insensitivity; ring interferometer; self-imaging effect; shearing-type near-field Sagnac interferometer; ultra-compact size; wavelength division multiplexing; wavelength insensitivity; Interference; Optical devices; Optical interferometry; Optical losses; Optical polarization; Optical waveguides; Optimized production technology; Phase measurement; Wavelength division multiplexing; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE

Conference_Location

San Francisco, CA

ISSN

1092-8081

Print_ISBN

0-7803-3895-2

Type

conf

DOI

10.1109/LEOS.1997.630690

Filename

630690