Title :
Evaluation of 1200 V-Si-IGBTs and 1300 V-SiC-JFETs for application in three-phase very sparse matrix AC-AC converter systems
Author :
Schafmeister, F. ; Herold, S. ; Kolar, J.W.
Author_Institution :
Power Electron. Syst. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
In this paper based on experimental investigations of the power semiconductor switching behavior and on analytical calculations the conduction and switching losses of it three-phase very sparse AC-AC matrix converter (VSMC) supplying a permanent magnet synchronous motor are discussed in detail. There, 1200 V-Si-IGBTs/1200 V-Si-ultra-fast-recovery diodes and 1300 V-SiC-JFET/Si-MOSFET cascodes are employed for realizing the converter power circuit. The worst case operating conditions are identified and the efficiencies resulting in dependency of the switching frequency and load current amplitude are shown in graphical form. Furthermore, the operating range of the VSMC with respect to the maximum admissible junction temperature of the power semiconductors is determined. Finally, topics to be treated in the continuation of the research are discussed briefly.
Keywords :
AC-AC power convertors; MOSFET; elemental semiconductors; insulated gate bipolar transistors; junction gate field effect transistors; losses; matrix convertors; p-n junctions; permanent magnet motors; power semiconductor diodes; silicon; silicon compounds; switching convertors; synchronous motors; 1200 V; 1300 V; IGBT; JFET; JFET/MOSFET cascode; Si; SiC; conduction losses; junction temperature; load current amplitude; permanent magnet synchronous motor; power semiconductor switching behavior; switching frequency; switching losses; three-phase very sparse matrix AC-AC converter systems; ultra-fast-recovery diodes; Circuits; Magnetic analysis; Magnetic switching; Matrix converters; Permanent magnet motors; Power semiconductor switches; Semiconductor diodes; Sparse matrices; Switching frequency; Switching loss;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-7768-0
DOI :
10.1109/APEC.2003.1179222