DocumentCode :
3177468
Title :
A 128kb high density portless SRAM using hierarchical bitlines and thyristor sense amplifiers
Author :
Wieckowski, Michael ; Chen, Gregory K. ; Kim, Daeyeon ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
4
Abstract :
A 128 kb portless SRAM is presented with 1024 rows per hierarchical bitline and CMOS thyristor-based local sense amplifiers. Each portless cell is 0.317 μm2 in 45 nm CMOS and consumes 50.8 fJ of energy per access at a 17.86 ns cycle time. A 65% read SNM improvement and a 33% leakage power reduction is achieved over a conventional 6T design. The thyristor-based sense amplifier occupies 2.4 μm2 and provides variation tolerant sensing within the hierarchical column pitch.
Keywords :
CMOS memory circuits; SRAM chips; amplifiers; thyristor circuits; CMOS thyristor-based local sense amplifier; SNM improvement; hierarchical bitlines; hierarchical column pitch; high density portless SRAM; leakage power reduction; memory size 128 KByte; size 45 nm; Arrays; Metallization; Noise; Organizations; Random access memory; Standards organizations; SRAM; low-power; memory; noise-margin; stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770708
Filename :
5770708
Link To Document :
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