Title :
Laser test of adhesion of thin metal films on glass substrate
Author :
Fedenev, A.V. ; Alekseev, S.B. ; Goncharenko, I.M. ; Koval, N.N. ; Lipatov, E.I. ; Orlovskii, V.M. ; Tarasenko, V.F. ; Shulepov, M.A.
Author_Institution :
High Current Electron. Inst., Tomsk, Russia
Abstract :
In this paper, it is suggested to use pulsed laser radiation to define adhesion of thin metallic films to the substrate and surface defects detection. The preliminary experimental data on Xe- and XeCl-lasers interaction with thin films of metals deposited on glass using technology of vacuum-arc evaporation are presented in the paper. Threshold laser radiation power densities necessary for film detachment from the substrate are determined. Thus, a possibility of testing of thin film adhesion by focused pulsed laser irradiation with known power distribution over cross-section has been demonstrated.
Keywords :
adhesion; gas lasers; high-speed optical techniques; laser beam effects; metallic thin films; optical films; optical glass; vacuum deposited coatings; xenon compounds; Xe; Xe-laser; XeCl; XeCl-laser interaction; adhesion; film detachment; glass substrate; laser testing; power distribution; pulsed laser radiation; surface defect detection; thin film adhesion; thin metal films; threshold laser radiation power density; vacuum-arc evaporation; Adhesives; Glass; Optical pulses; Power lasers; Pulsed laser deposition; Radiation detectors; Sputtering; Substrates; Surface emitting lasers; Testing;
Conference_Titel :
Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
Print_ISBN :
0-7803-7734-6
DOI :
10.1109/CLEOE.2003.1313645
