Title :
On-wafer characterization of monolithic millimeter-wave integrated circuits by a picosecond optical electronic technique
Author :
Polak-Dingels, P. ; Hung, H.-L.A. ; Smith, T. ; Huang, H.C. ; Webb, K.J. ; Lee, C.H.
Author_Institution :
Lab. for Phys. Sci., College Park, MD, USA
Abstract :
A picosecond optical electronic sampling technique for the characterization of monolithic microwave integrated circuits (MMICs) has been developed. The measured time-domain response allows the spectral transfer function of the MMIC to be obtained. This technique was applied to characterize the frequency response of a two-stage Ka-band MMIC amplifier. The broadband results agree well with those obtained by conventional network analyzer measurements.<>
Keywords :
microwave amplifiers; microwave integrated circuits; monolithic integrated circuits; Ka-band; MMICs; frequency response; monolithic millimeter-wave integrated circuits; picosecond optical electronic technique; sampling technique; spectral transfer function; time-domain response; Integrated optics; MMICs; Microwave integrated circuits; Microwave theory and techniques; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Photonic integrated circuits; Sampling methods; Stimulated emission;
Conference_Titel :
Microwave Symposium Digest, 1988., IEEE MTT-S International
Conference_Location :
New York, NY, USA
DOI :
10.1109/MWSYM.1988.22021
