Title :
A study of the effects of BGA solder geometry on fatigue life and reliability assessment
Author :
Yu, Qiang ; Shiratori, Masaki ; Ohshima, Yoichi
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Japan
Abstract :
The authors have developed isothermal shear-fatigue-test equipment to estimate the fatigue life of BGA solder joints. The isothermal fatigue test was used to give proper and accurate estimation of the thermal fatigue life of solder joints. In this study, in order to investigate how the fatigue life behaviour is affected by the geometry of BGA solder joints, three different kinds of BGA solder joints were chosen, and the fatigue lives of the initial cracks were tested by the isothermal fatigue-test equipment. Furthermore, the nonlinear stress-strain behaviour in BGA solder joints was studied by finite element analysis (FEA). It was found that the analytical results of FEA were affected by the analytical models, and the fatigue lives of the three different joints could be assessed by one master Coffin-Manson law, when the nonlinear equivalent strain range was used as the estimation parameter, and the strain range was analyzed by a three-dimensional FEA model
Keywords :
ball grid arrays; fatigue testing; finite element analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; soldering; stress analysis; stress-strain relations; thermal stress cracking; 3D FEA model; BGA solder geometry; BGA solder joint geometry; BGA solder joints; cracks; fatigue life; finite element analysis; isothermal fatigue test; isothermal fatigue-test equipment; isothermal shear-fatigue-test equipment; master Coffin-Manson law; models; nonlinear equivalent strain range; nonlinear stress-strain behaviour; reliability; solder joints; thermal fatigue life; Analytical models; Capacitive sensors; Fatigue; Finite element methods; Geometry; Isothermal processes; Life estimation; Life testing; Parameter estimation; Soldering;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4475-8
DOI :
10.1109/ITHERM.1998.689550