Title :
Dynamic testing of ADCs using wavelet transforms
Author :
Yamaguchi, Takahiro ; Soma, Mani
Author_Institution :
Advantest Lab. Ltd., Zip, Japan
Abstract :
This paper introduces a new method for evaluating non-idealities in ADCs using wavelet transforms. Compared with conventional testing methods, this method can shorten the test time and improve test quality during production testing of ADCs
Keywords :
VLSI; analogue-digital conversion; computational complexity; digital simulation; electronic equipment testing; production testing; wavelet transforms; ADC testing; dynamic testing; production testing; test quality; test time; wavelet transforms; Additive noise; Circuit testing; Curve fitting; Integrated circuit testing; Quantization; Signal processing; Signal to noise ratio; System testing; Vehicle dynamics; Wavelet transforms;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639640
