DocumentCode
318403
Title
Dynamic testing of ADCs using wavelet transforms
Author
Yamaguchi, Takahiro ; Soma, Mani
Author_Institution
Advantest Lab. Ltd., Zip, Japan
fYear
1997
fDate
1-6 Nov 1997
Firstpage
379
Lastpage
388
Abstract
This paper introduces a new method for evaluating non-idealities in ADCs using wavelet transforms. Compared with conventional testing methods, this method can shorten the test time and improve test quality during production testing of ADCs
Keywords
VLSI; analogue-digital conversion; computational complexity; digital simulation; electronic equipment testing; production testing; wavelet transforms; ADC testing; dynamic testing; production testing; test quality; test time; wavelet transforms; Additive noise; Circuit testing; Curve fitting; Integrated circuit testing; Quantization; Signal processing; Signal to noise ratio; System testing; Vehicle dynamics; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639640
Filename
639640
Link To Document