Title :
A case study of the test development for the 2nd generation ColdFireR microprocessors
Author :
Amason, Dale ; Crouch, Alfred L. ; Eisele, Renny ; Giles, Grady ; Mateja, Michael
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
A case study of the development of the design for test methodology of the second generation of the ColdFireR Microprocessor Family is described from the viewpoint of goals, initial strategy and implementation. Methodology includes at-speed scan path design, path delay testing, IDDQ and direct access test modes for embedded memories. Scan tests are applied with timing identical to that specified for peak performance normal operation
Keywords :
automatic test equipment; automatic testing; computer testing; delays; design for testability; electric current measurement; integrated circuit testing; integrated memory circuits; logic testing; microprocessor chips; ColdFire microprocessor; IDDQ test; at-speed scan path design; direct access test; embedded memories; path delay testing; test development; timing; Automatic testing; Automation; Computer aided software engineering; Costs; Design methodology; Guidelines; Logic design; Logic testing; Microprocessors; Timing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639645
