Design, fabrication and use of mixed-signal IC testability structures

Author

Parker, Kenneth P. ; McDermid, John E. ; Browen, Rodney A. ; Nuriya, Kozo ; Hirayama, Katsuhiro ; Matsuzawa, Akira

Author_Institution

Manuf. Test. Div., Hewlett-Packard Co., Loveland, CO, USA

fYear

1997

fDate

1-6 Nov 1997

Firstpage

489

Lastpage

498

Abstract

The goals of the studies of the MNABST-1 IC device were as follows: study the technical and economic feasibility of adding P1149.4 structures into mixed-signal devices; elicit design considerations at the silicon level and for silicon design software; study the interoperability of P1149.4 with 1149.1 interconnection test algorithms; study the efficacy of discrete component and network value measurements; establish limits on analog value measurements; and predict the capabilities of P1149.4 in the future. The results shows that we can emulate the capabilities of in-circuit test for most types of components currently tested this way. This will preserve the advantages of this well-known technology into the future when direct nodal access will no longer be the rule, but rather the exception

Keywords

CMOS integrated circuits; automatic testing; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; 1149.1 interconnection test algorithms; DFT; MNABST-1 IC device; P1149.4 structures; Si design software; capacitor measurement; economic feasibility; in-circuit test; mixed-signal IC testability; technical feasibility; Algorithm design and analysis; Analog integrated circuits; Economic forecasting; Fabrication; Integrated circuit testing; Silicon; Software algorithms; Software design; Software measurement; Software testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1997. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-4209-7

Type

conf

DOI

10.1109/TEST.1997.639655

Filename

639655