DocumentCode :
3184871
Title :
Some questions of scale in simulation, and a few answers
Author :
Kester, James E.
Author_Institution :
SofTech Inc., Fairborn, OH, USA
fYear :
1992
fDate :
18-22 May 1992
Firstpage :
610
Abstract :
Discusses areas in which the scale of objects and events may drive design choices regarding the model or simulation system to be built. Spatial considerations encompass both the geometric scale of the system and the desired resolution of information. For modeling of electromagnetic phenomena, the scale for adequate resolution will usually include a resolution cell or pixel size. With each determination of spatial scale, there is a correlated determination of temporal increment or resolution. Pixel size and resolution cell size are both related to time-based measures of the electromagnetic system, pulse length and frequency, for instance. The physics (or algorithms) of the system must also be analyzed for relevance based on a spatial and/or temporal scale. An example from computational fluid dynamics demonstrates that, for a given geometry and subject of interest, some effects will be negligible, while others will dominate. The author provides some considerations in answering the following questions: (1) What are the technological limits of scale in various parts of the system? (2) How does one validate the quality of the output of a simulation system?
Keywords :
aerospace simulation; electromagnetic wave propagation; fluid dynamics; computational fluid dynamics; design choices; electromagnetic phenomena; geometric scale; pixel size; pulse length; resolution cell; simulation system; spatial scale; technological limits; time-based measures; Discrete event simulation; Drives; EMP radiation effects; Electromagnetic measurements; Electromagnetic modeling; Frequency measurement; Length measurement; Pulse measurements; Size measurement; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1992. NAECON 1992., Proceedings of the IEEE 1992 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0652-X
Type :
conf
DOI :
10.1109/NAECON.1992.220559
Filename :
220559
Link To Document :
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