Title :
Evaluation of Linearity Characteristics in Digital Voltmeters Using a PJVS System With a 10-K Cooler
Author :
Maruyama, Michitaka ; Takahashi, Hikari ; Katayama, Kenichi ; Yonezawa, Takahito ; Kanai, Takahiro ; Iwasa, Akio ; Urano, Chiharu ; Kiryu, Shogo ; Kaneko, Nobu-hisa
Author_Institution :
Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Abstract :
We have evaluated the linearity of commercial digital voltmeters (DVMs) using a programmable Josephson voltage standard (PJVS) system. The PJVS system is composed of a 524288-niobium nitride-based Josephson junction array that has the ability to generate arbitrary output voltages up to 17 V with a resolution of 12 bits. In our system, the junction array is operated in a 10-K compact cooler without a liquid-helium coolant. Up to now, we have succeeded in generating accurate dc voltage levels of up to approximately 13 V using this system. In this paper, we demonstrate our PJVS system as a tool for investigating the linearity characteristics of commercial DVMs, with an accuracy level of 0.1 μV/V or better, and discuss the uncertainty sources in these measurements.
Keywords :
digital voltmeters; measurement standards; measurement uncertainty; niobium compounds; superconducting arrays; superconducting junction devices; voltage measurement; PJVS system; commercial DVM; compact cooler; digital voltmeter; linearity characteristics evaluation; niobium nitride-based Josephson junction array; programmable Josephson voltage standard; temperature 10 K; uncertainty source; voltage 17 V; Accuracy; Linearity; Measurement uncertainty; Standards; Switches; Uncertainty; Voltage measurement; DC voltage; Josephson junction array; digital voltmeter (DVM); linearity; mechanical cooler; precision measurements; programmable Josephson voltage standard (PJVS);
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2015.2418455
