Test development and deployment tool-set for mixed-signal and digital devices

A tool-set and data flow is proposed to shorten the test development and deployment times and to ensure test data integrity throughout the life-cycle of an IC. In perspective, the approach targets both digital and mixed-signal devices. The approach employs a number of existing tools and technologies, while also perspectively enabling cross-academia and -industry research and development on described test-process-related issues, by enabling an actual distributed technical setting.