Title :
Static nonlinearity testing of D/A converters
Author :
Vargha, Balázs ; Schoukens, Johan ; Rolain, Yves
Author_Institution :
Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Hungary
Abstract :
The paper presents a diagnostic tool for analyzing the bit intermodulation in D/A converters. Bit intermodulation causes linearity errors which degrade the performance of the converter. The better understanding of these errors can lead to design and build more accurate converters. A linear transformation of the Walsh transform of the integrated nonlinearity diagram is shown to be sufficient to extract the bit intermodulation terms and their noise sensitivity. Practical applicability of the proposed method is shown by measurements performed on a custom designed test circuit
Keywords :
Walsh functions; digital-analogue conversion; integrated circuit noise; integrated circuit testing; intermodulation distortion; D/A converters; Walsh transform; bit intermodulation; custom designed test circuit; diagnostic tool; intermodulation terms; linearity errors; noise sensitivity; static nonlinearity testing; Circuit testing; Computer errors; Data mining; Degradation; Discrete transforms; Information analysis; Information systems; Linearity; Topology; World Wide Web;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.929489
