• DocumentCode
    318971
  • Title

    Quantifying The Learning Curve Of A Vision Inspection System

  • Author

    Naim, M.M. ; Chan, J.P. ; Huneiti, A.M.

  • Author_Institution
    Cardiff School of Engineering, U. W.C. Cardiff, U.K.
  • fYear
    1994
  • fDate
    3-5 Oct 1994
  • Firstpage
    509
  • Lastpage
    516
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Factory 2000 - Advanced Factory Automation, Fourth International Conference on (Conf. Publ. No. 398)
  • Conference_Location
    IET
  • Print_ISBN
    0-85296-626-1
  • Type

    conf

  • Filename
    644269