• DocumentCode
    3190243
  • Title

    Wireline/wireless RF-Interconnect for future SoC

  • Author

    Tam, Sai-Wang ; Chang, M-C Frank ; Kim, Jongsun ; Byun, Gyungsu

  • Author_Institution
    Marvell Semicond., Santa Clara, CA, USA
  • fYear
    2011
  • fDate
    Nov. 30 2011-Dec. 2 2011
  • Firstpage
    45
  • Lastpage
    48
  • Abstract
    In the era of the nanometer CMOS technology, due to stringent system requirements in power, performance and other fundamental physical limitations (such as mechanical reliability, thermal constraints, overall system form factor, etc.), future SOC systems are relying more on ultra-high data rates scalable, re-configurable, highly compact and reliable interconnect fabric. To overcome such challenges, we explore the use of multiband wireline and wireless RF-Interconnect (RF-I) which can communicate simultaneously through multiple frequency bands with low power signal transmission, reconfigurable bandwidth and excellent mechanical flexibility and reliability. In this paper, we review recent advances in wireline and wireless RF-I in three different potential application domains, which include Network-on-Chips (NoCs), advanced memory interface and ultra-high speed contactless connectors.
  • Keywords
    CMOS integrated circuits; integrated circuit interconnections; integrated circuit reliability; network-on-chip; RF-I; SoC; advanced memory interface; mechanical flexibility; nanometer CMOS technology; network-on-chips; potential application domains; power signal transmission; reliability; ultra high speed contactless connectors; wireless RF-interconnect; wireline RF-interconnect; CMOS integrated circuits; Connectors; Integrated circuit interconnections; Radio frequency; Receivers; System-on-a-chip; Wireless communication; Advanced Memory Interface; Amplitude Shift Key (ASK); Contactless Connector; Network-On-Chips(NoCs); Wireline and Wireless RF-Interconnect(RF-I);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology (RFIT), 2011 IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4577-0517-5
  • Type

    conf

  • DOI
    10.1109/RFIT.2011.6141771
  • Filename
    6141771