Title :
A new dynamic, self-consistent electro-thermal model of power HBTs and a novel interpretation of thermal collapse loci in multi-finger devices
Author :
Cappelluti, F. ; Bonani, F. ; Guerrieri, S. Donati ; Ghione, G. ; Peroni, M. ; Cetronio, A. ; Graffitti, R.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Italy
Abstract :
A new self-consistent dynamic electro-thermal model for power HBTs is presented coupling a circuit-oriented electrical model fitted on experimental data with a full frequency domain thermal model. The thermal model provides the exact frequency behaviour of the device thermal impedance through a quasi-3D approach, rather than a simple single- or multi-pole rational approximation. The self-consistent solution is achieved, in large-signal periodic conditions, through harmonic balance analysis. The dynamic model enables us to discuss the behaviour of thermal collapse in multi-finger devices not only in DC, but also in AC conditions. In particular, a new interpretation is proposed for the thermal collapse loci of such devices in terms of bifurcations, thus providing a simpler and more straightforward stability criterion with respect to those already presented in the literature
Keywords :
bifurcation; equivalent circuits; heterojunction bipolar transistors; power bipolar transistors; semiconductor device models; stability criteria; thermal analysis; AC conditions; DC conditions; bifurcations; circuit-oriented electrical model; device thermal impedance; dynamic self-consistent model; electro-thermal model; full frequency domain thermal model; harmonic balance analysis; large-signal periodic conditions; multi-finger devices; power HBTs; quasi-3D approach; stability criterion; thermal collapse loci; Bifurcation; Circuits; Electrothermal effects; Equations; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Impedance; Power system modeling; Thermal conductivity;
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
DOI :
10.1109/CICC.2001.929809