DocumentCode :
3191494
Title :
Determination of the valence-band offset of CdS/CIS solar cell devices by target factor analysis
Author :
Niles, D.W. ; Contreras, M. ; Ramanathan, K. ; Noufi, R.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
833
Lastpage :
836
Abstract :
X-ray photoemission spectroscopy (XPS) is used to determine and compare the valence-band offsets (ΔEv) for CdS grown by chemical bath deposition on single-crystal and thin-film CuInSe2 (CIS). The thin-film CIS device was suitable for photovoltaic energy production. By sputtering through the CdS/CIS interface and reducing the depth profile with target factor analysis, the magnitude of ΔEv was determined to be ΔEv=1.06±0.15 eV for both the single-crystal and thin-film interfaces. This determination of ΔEv is about 0.25 eV larger than many previously reported estimations CdS grown by physical vapor deposition on CIS and helps explain the record performance of CdS/CIS photovoltaic devices
Keywords :
II-VI semiconductors; X-ray photoelectron spectra; cadmium compounds; copper compounds; indium compounds; semiconductor device testing; semiconductor growth; semiconductor thin films; solar cells; sputter deposition; sputtered coatings; ternary semiconductors; valence bands; 0.91 to 1.21 eV; CdS-CuInSe2; CdS-CuInSe2 solar cells; X-ray photoemission spectroscopy; chemical bath deposition; depth profile; interfaces; performance measurements; photovoltaic energy production; sputtering; target factor analysis; valence-band offset; Chemicals; Computational Intelligence Society; Photoelectricity; Photovoltaic cells; Photovoltaic systems; Production; Solar power generation; Spectroscopy; Sputtering; Thin film devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564257
Filename :
564257
Link To Document :
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