DocumentCode :
3191573
Title :
Analysis of power distribution network in TSV-based 3D-IC
Author :
Kim, Kiyeong ; Lee, Woojin ; Kim, Jaemin ; Song, Taigon ; Joohee Kim ; Jun So Pak ; Joungho Kim ; Hyungdong Lee ; Kwon, Yongkee ; Park, Kunwoo
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
fYear :
2010
fDate :
25-27 Oct. 2010
Firstpage :
177
Lastpage :
180
Abstract :
To reduce simultaneous switching noise (SSN) in a PDN design of TSV-based GPU system, the impedance properties of the hierarchical PDN in the TSV-based GPU system were estimated and analyzed. The system consisted of triple-stacked TSV-based DRAMs on top of the GPU connected by TSVs, a silicon interposer, and a backside re-distribution layer (BS-RDL). A segmentation-based impedance-estimation method was used for the estimation of the total PDN impedance combining models of the on-chip PDN, the power/ground (P/G) TSV, and the coplanar P/G line in the BS-RDL. The impedance properties of the PDN were also analyzed with respect to variations in the number of P/G TSVs and P/G lines in the BS-RDL and variation of the capacitance of the on-chip decoupling capacitor embedded in the on-chip PDN.
Keywords :
DRAM chips; distribution networks; integrated circuit noise; power integrated circuits; switching circuits; three-dimensional integrated circuits; BS-RDL; PDN design; PDN impedance combining models; SSN; TSV-based 3D-IC; TSV-based GPU system; backside redistribution layer; coplanar P/G line; hierarchical PDN; impedance property; onchip PDN; onchip decoupling capacitor; power distribution network analysis; power/ground TSV; segmentation-based impedance-estimation method; silicon interposer; simultaneous switching noise; triple-stacked TSV-based DRAM; Capacitance; Graphics processing unit; Impedance; Inductance; Random access memory; System-on-a-chip; Through-silicon vias; Hierarchical power distribution network (PDN); P/G TSV; coplanar P/G line; on-chip decoupling capacitor; segmentation method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-6865-2
Electronic_ISBN :
978-1-4244-6866-9
Type :
conf
DOI :
10.1109/EPEPS.2010.5642575
Filename :
5642575
Link To Document :
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