DocumentCode :
3193379
Title :
Dependance of monopulse radar boresight error on incident E-field polarization
Author :
Wilson, Capt Kelce S ; Pyati, Vittal P. ; Temple, Capt Michael A
Author_Institution :
AF Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
1995
fDate :
8-11 May 1995
Firstpage :
568
Lastpage :
572
Abstract :
Boresight error (BSE), the angular difference between a target´s actual and radar-indicated position, is influenced by protective radomes used on airborne platforms. Research results have demonstrated a reliable computer modeling technique for predicting the BSE of electrically large radar-radome systems. This technique, based on a ray-trace receive formulation using geometric optics (GO), was extended to investigate the dependance of radome-induced BSE on various combinations of aperture scan angle, element polarization, and incident wave polarization. The results obtained compare very well with available empirical, published, and measured data for the specific scan angles and polarization cases considered. Generally, the BSE exhibits less dependance on incident wave polarization when the aperture elements are linearly polarized and a higher degree of sensitivity when aperture elements are circularly polarized
Keywords :
airborne radar; electromagnetic fields; electromagnetic wave polarisation; geometrical optics; radar computing; radar signal processing; radomes; airborne platforms; aperture scan angle; circularly polarized elements; computer modeling technique; electrically large radar-radome systems; element polarization; geometric optics; incident E-field polarization; incident wave polarization; linearly polarized elements; measured data; military systems; monopulse processing systems; monopulse radar boresight error; protective radomes; ray-trace receive formulation; Apertures; Computer errors; Geometrical optics; Optical polarization; Predictive models; Protection; Radar; Radio frequency; Surface waves; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radar Conference, 1995., Record of the IEEE 1995 International
Conference_Location :
Alexandria, VA
Print_ISBN :
0-7803-2121-9
Type :
conf
DOI :
10.1109/RADAR.1995.522610
Filename :
522610
Link To Document :
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