DocumentCode :
3193745
Title :
Thermal management with additive multilayer circuitry on metal substrates
Author :
Matijasevic, Goran ; Gandhi, Pradeep ; Gallagher, Catherine ; Xi, Xiaomei ; Ha, Linh
Author_Institution :
Ormet Corp., Carlsbad, CA, USA
fYear :
1998
fDate :
27-30 May 1998
Firstpage :
530
Lastpage :
535
Abstract :
High density microelectronic circuit substrates have been fabricated by additive processing on metal substrates. The circuit traces and vias are fabricated using an electrically conductive paste and permanent photoimageable dielectric materials developed for microvia technologies. The conductive material is a metal-polymer composite based on transient liquid phase sintering (TLPS) technology. Bulk thermal conductivity measurements of the TLPS conductive composites show that they have similar thermal conductivity to solder. The low processing temperature (<250°C) allows their use on Al substrates. The key attribute of the technology is its fine line multilayer circuit capability on metal substrates. To show the advantages of the additive metal substrate technology over conventional approaches, thermal dissipation has been measured by temperature mapping using emissivity compensated IR imaging. A serpentine pattern was fabricated on a variety of substrates, including Cu-clad FR-4 and Al. Thermal imaging shows the much higher power dissipating capabilities of the Al substrate. A prototype thermal test board was also fabricated and assembled with power components. The thermal dissipation of the power components was measured to be up to 75% more efficient than the baseline, a printed circuit board with thermal vias and a heat sink. The multilayer circuit technology described here was also used to fabricate a large area heat sensor which has 1600 thermocouples per square centimeter and a sensitivity of 40 mV/(W/cm2)
Keywords :
conducting polymers; cooling; dielectric thin films; filled polymers; fine-pitch technology; infrared imaging; integrated circuit interconnections; integrated circuit metallisation; integrated circuit packaging; photolithography; sintering; temperature sensors; thermal conductivity; thermal management (packaging); thermocouples; 250 C; Al; Al substrates; Cu; Cu-clad FR-4 substrate; TLPS conductive composites; additive metal substrate technology; additive multilayer circuitry; additive processing; circuit traces; conductive material; electrically conductive paste; emissivity compensated IR imaging; fine line multilayer circuit capability; heat sink; high density microelectronic circuit substrates; large area heat sensor; metal substrates; metal-polymer composite; microvia technology; multilayer circuit technology; permanent photoimageable dielectric materials; power components; power dissipation; printed circuit board; processing temperature; prototype thermal test board; sensitivity; serpentine pattern; solder; temperature mapping; thermal conductivity; thermal conductivity measurements; thermal dissipation; thermal imaging; thermal management; thermal vias; thermocouples; transient liquid phase sintering technology; vias; Additives; Circuits; Dielectric materials; Dielectric substrates; Microelectronics; Nonhomogeneous media; Optical imaging; Temperature measurement; Thermal conductivity; Thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
ISSN :
1089-9870
Print_ISBN :
0-7803-4475-8
Type :
conf
DOI :
10.1109/ITHERM.1998.689616
Filename :
689616
Link To Document :
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