Title :
ZnO/ZnO:Al window and contact layer for thin film solar cells: high rate deposition by simultaneous RF and DC magnetron sputtering
Author :
Ellimer, K. ; Wendt, R. ; Cebulla, R.
Author_Institution :
Dept. Solar Energetics, Hahn-Meitner-Inst., Berlin, Germany
Abstract :
RF-magnetron sputtering of zinc oxide films (ZnO:Al and ZnO) is nearly exclusively used for the deposition of the window and contact layer for heterojunction thin film solar cells based on absorber materials like CuInSe2, CdTe or CulnS2. A drawback of this sputtering technique is the small deposition rate. This is caused by the low DC-voltage that develops at the target, since the sputtering rate in the energy range below 1 keV depends linearly on the acceleration voltage in the cathode fall. In order to increase the target voltage a simultaneous excitation by RF (13.56 MHz) and DC has been used. In this way, the advantages of both excitation modes have been combined for sputtering from oxidic targets (ZnO and ZnO:Al). Excitation by DC increases the deposition rate up to a factor of 1.5. On the other hand RF-excitation decreases the specific resistance significantly. This new deposition method has been used for the preparation of ZnO:Al/ZnO/CdS/CuInS2-solar cells
Keywords :
II-VI semiconductors; aluminium; cadmium compounds; copper compounds; indium compounds; semiconductor device testing; semiconductor doping; semiconductor thin films; solar cells; sputter deposition; sputtered coatings; ternary semiconductors; zinc compounds; 13.56 MHz; ZnO:Al-ZnO-CdS-CuInS2; ZnO:Al/ZnO/CdS/CuInS2 solar cells; contact layer; deposition rate; oxidic targets; simultaneous RF/DC magnetron sputtering; specific resistance; sputtering technique; thin-film solar cells; window layer; Ceramics; Magnetic materials; Optical films; Optical pumping; Photovoltaic cells; Radio frequency; Sputtering; Substrates; Voltage; Zinc oxide;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564269