Title :
Analysis in 3-D of the complex and arbitrary bilateral finlines
Author :
Fernandes, Humberto César Chaves ; Neto, J.de A.S.
Author_Institution :
Dept. of Electr. Eng., Univ. Fed. do Rio Grande do Norte, Natal, Brazil
Abstract :
An electromagnetic application is developed to obtain simultaneously the effective dielectric constant and the attenuation constant of arbitrary bilateral fin lines with semiconductor substrate and finite conductor thickness. Also the concise Transverse Transmission Line-TTL full wave method is used in the analysis. Results of the complex propagation as a function of the frequency and different dimensions and conductivity of the substrate, are obtained in 3-D
Keywords :
fin lines; permittivity; waveguide theory; 3D analysis; TTL full wave method; attenuation constant; complex bilateral finlines; complex propagation; effective dielectric constant; finite conductor thickness; semiconductor substrate; transverse transmission line method; Attenuation; Boundary conditions; Conductors; Dielectric constant; Electromagnetic fields; Electromagnetic propagation; Equations; Finline; Frequency; Substrates;
Conference_Titel :
Microwave and Optoelectronics Conference, 1997. Linking to the Next Century. Proceedings., 1997 SBMO/IEEE MTT-S International
Conference_Location :
Natal
Print_ISBN :
0-7803-4165-1
DOI :
10.1109/SBMOMO.1997.646794
