DocumentCode :
3197565
Title :
Flipchip bonding of ultrahin Si dies onto PEN/PET substrates with low cost circuitry
Author :
Van den Brand, Jeroen ; Kusters, Roel ; Heeren, Mark ; Van Remoortere, Bart ; Dietzel, Andreas
Author_Institution :
Holst Centre, TNO-Netherlands Organ. for Appl. Sci. Res., Eindhoven, Netherlands
fYear :
2010
fDate :
13-16 Sept. 2010
Firstpage :
1
Lastpage :
6
Abstract :
All-printed, cost effective, smart electronic products are expected to be used in a wide range of applications and in large quantities in our society. The substrate material for these applications will be low cost materials like PEN or PET foils. For the functionality of the printed electronics product it often will still be required to integrate a Si chip. To keep the flexibility of the package and not to add too much to the thickness, the chip needs to be integrated into the product as a bare, thinned die. Because of the low temperature stability of the PEN and PET and the use of printed conductors it is necessary to interconnect the chip using an adhesive. The current paper specifically addresses the challenges associated with this. Research efforts will be discussed on the flip chip bonding of ultrathin (i.e. thickness 20 μm) bare chips on printed circuitry on both PEN and PET foils using a typical anisotropic conductive adhesive (ACA). Based on the results it can be concluded that a reproducible, low contact resistance and a good lifetime and flexural durability can be achieved over a wide range of bonding forces and temperatures.
Keywords :
bending strength; bonding processes; conductive adhesives; contact resistance; durability; flexible electronics; flip-chip devices; microassembling; polymers; ACA; PEN foil; PEN/PET substrates; PET foil; anisotropic conductive adhesive; flexural durability; flipchip bonding; low contact resistance; low cost circuitry; low temperature stability; printed circuitry; printed conductors; printed electronics product; smart electronic products; substrate material; ultrathin bare chips; ultrathin silicon dies; Bonding; Bonding forces; Positron emission tomography; Substrates; Temperature distribution; Temperature measurement; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2010 3rd
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-8553-6
Electronic_ISBN :
978-1-4244-8554-3
Type :
conf
DOI :
10.1109/ESTC.2010.5642872
Filename :
5642872
Link To Document :
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