• DocumentCode
    3198215
  • Title

    Investigation of wettability and interface reactions of Sn-Pb, Sn-Cu, Sn-Ag and Sn-Ag-Cu solders for solar cell interconnections

  • Author

    Schindler, Sebastian ; Wiese, Steffen

  • Author_Institution
    Fraunhofer-Center for Silicon-Photovoltaics, Halle, Germany
  • fYear
    2010
  • fDate
    13-16 Sept. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The soldering and wetting behaviour for lead-contained and lead-free solders joints has been well studied in electronics packaging applications over the past years. Lead-contained solders were widely used because of their well know wetting behaviour and mechanical properties, even in solar cell string soldering. Establishing the Si crystalline solar cell module manufacturing as an environment-friendly process more substantial income of the soldering process reliability and efficiency for photovoltaic applications is still necessary. The paper reveals key parameters to ensure the quality and reliability of solar cell joint interconnections and shows that the conditions of wetting behaviour and microstructural properties are of tremendous importance for silicon-based photovoltaic modules with lifetime guarantees up to 25 years.
  • Keywords
    copper; electronics packaging; elemental semiconductors; lead; reliability; silicon; silver; soldering; tin; wetting; Si; Sn-Ag-Cu; Sn-Cu; Sn-Pb; crystalline solar cell module manufacturing; electronics packaging applications; interface reactions; lead-contained solders joints; lead-free solders joints; mechanical properties; microstructural properties; photovoltaic applications; solar cell interconnections; solar cell string soldering; soldering process reliability; wetting behaviour; Heating; Lead; Metallization; Photovoltaic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2010 3rd
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4244-8553-6
  • Electronic_ISBN
    978-1-4244-8554-3
  • Type

    conf

  • DOI
    10.1109/ESTC.2010.5642904
  • Filename
    5642904