• DocumentCode
    3200682
  • Title

    Environmental degradation of utility power connectors in a harsh environment

  • Author

    Callen, B.W. ; Johnson, B. ; King, P. ; Timsit, R.S. ; Abbott, W.H.

  • Author_Institution
    AMP Global Technol., Markham, Ont., Canada
  • fYear
    1999
  • fDate
    4-6 Oct. 1999
  • Firstpage
    63
  • Lastpage
    76
  • Abstract
    This paper reports on an investigation of the effects of a marine atmospheric environment on the performance of aluminum bolted, compression, and fired wedge type power connectors. These connector types are representative of the three major connector technologies used in electrical distribution systems throughout the world. The atmospheric test site was situated on the seacoast in Daytona Beach, Florida. The test specimens consisted of sections of aluminum and copper conductors joined together by a connector. The paper describes the performance and lifetime of the different connector types exposed to the harsh marine environment. Examinations of failed connectors revealed that failure in all three connector types was ultimately due to galvanic corrosion at the aluminum/copper interfaces within the connectors. The failure rate was largest for compression connections. Bolted connections failed somewhat less rapidly. The failure rate for fired-wedge connections was the lowest.
  • Keywords
    aluminium; copper; corrosion; electric connectors; environmental degradation; failure analysis; marine systems; Al-Cu; aluminum conductor; aluminum/copper interface; bolted connection; compression connection; copper conductor; electrical distribution system; environmental degradation; failure rate; fired-wedge connection; galvanic corrosion; harsh marine environment; lifetime; utility power connector; Aluminum; Conductors; Connectors; Copper; Corrosion; Degradation; Laboratories; Marine technology; Ocean temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on
  • Conference_Location
    Pittsburgh, PA, USA
  • Print_ISBN
    0-7803-5549-0
  • Type

    conf

  • DOI
    10.1109/HOLM.1999.795929
  • Filename
    795929