DocumentCode :
3202018
Title :
Interface States of Heterojunction Solar Cells
Author :
Fahrner, W.R. ; Mueller, T. ; Scherff, M. ; Knoner, D. ; Neitzert, H.C.
Author_Institution :
Chair of Electron. Devices, Hagen Univ.
Volume :
1
fYear :
2006
fDate :
38838
Firstpage :
1160
Lastpage :
1163
Abstract :
The dispersion of conventional amorphous silicon (a-Si:H)/crystalline silicon (c-Si) heterojunction solar cells shows a single time constant behavior. However, when a multicrystalline substrate is used, an additional "hump" appears in the C-f and R-f curves. A possible explanation by the introduction of a second time constant fails. As an alternative, interface states are considered as the reason of the hump. Thus, an equivalent circuit is established which is used to extract the parallel conductance and capacitance caused by the interface states. A bell-shaped conductance (normalized to frequency) and a step-shaped capacitance appear as predicted by Shockley-Hall-Read theory. The evaluation can be further improved by application of the statistical model (assumption of a fluctuating surface potential). The final data are a surface state density Dit of 2.3 1012 V-1cm-2, a time constant tauit of 1.7 ms and a standard deviation a of 0.8
Keywords :
amorphous semiconductors; elemental semiconductors; interface states; semiconductor heterojunctions; silicon; solar cells; surface potential; surface states; C-f curve; R-f curve; Shockley-Hall-Read theory; Si-Si; amorphous silicon-crystalline silicon heterojunction solar cells; bell-shaped conductance; equivalent circuit; interface states; multicrystalline substrate; parallel conductance; standard deviation; statistical model; step-shaped capacitance; surface potential; surface state density; Admittance measurement; Capacitance; Crystallization; Electrical resistance measurement; Frequency measurement; Heterojunctions; Impedance measurement; Interface states; Photovoltaic cells; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
Type :
conf
DOI :
10.1109/WCPEC.2006.279368
Filename :
4059841
Link To Document :
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