• DocumentCode
    3202810
  • Title

    Test software at Texas Instruments: what SEI level is appropriate?

  • Author

    Payne, Jim ; Griffith, Shawn

  • Author_Institution
    Defense Syst. & Electron. Group, Texas Instrum. Inc., Lewisville, TX, USA
  • fYear
    1995
  • fDate
    8-10 Aug. 1995
  • Firstpage
    196
  • Lastpage
    203
  • Abstract
    In 1989, Texas Instruments (TI) as a corporation embarked on an aggressive mission to improve the quality of its internally developed software. As a part of this ongoing effort, the Test Engineering Department of the Defense Systems and Electronics Group (DSEG) evaluated existing test software development practices and procedures. Using the Software Engineering Institute´s (SEI) Capability Maturity Model (CMM) to measure software process quality, DSEG Test Engineering Department was internally appraised at SEI Level 2 and is currently working towards Level 3. There were unique challenges and difficulties relative to this achievement due to the wide diversity of test types, development standards, languages and platforms associated with test software. This paper presents the approach, schedule, lessons learned and some of the benefits which resulted from the efforts of the DSEG Test Engineering software quality thrust.
  • Keywords
    automatic test software; configuration management; software quality; software standards; Capability Maturity Model; Level 2; Level 3; Software Engineering Institute; Texas Instruments software; software development practices; software process quality; test software; Capability maturity model; Coordinate measuring machines; Current measurement; Electronic equipment testing; Instruments; Programming; Software engineering; Software quality; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-2621-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1995.522673
  • Filename
    522673