• DocumentCode
    3203741
  • Title

    Post-configuration repair strategy for asynchronous nanowire crossbar system

  • Author

    Wu, Jun ; Kim, Yong-Bin ; Choi, Minsu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    174
  • Lastpage
    177
  • Abstract
    The recently proposed asynchronous nanowire crossbar architecture is envisioned to enhance the manufacturability and robustness of nanowire crossbar-based configurable digital circuits by removing various timing-related failure modes. Even though the proposed clock-free nanowire crossbar architecture has numerous technical merits over its clocked counterparts, it is still subject to high defect rates inherently induced by the nondeterministic nanoscale assembly of nanowire crossbars. To address this issue, a novel post-configuration repair strategy specific to the asynchronous nanowire crossbar architecture has been proposed. The proposed repair strategy is to selectively test highly defect-prone ON-state programmed crosspoints and reconfigure the given logic function to circumvent the ON-crosspoints tested as faulty by utilizing redundant rows/columns.
  • Keywords
    assembling; asynchronous circuits; circuit testing; clocks; maintenance engineering; nanowires; asynchronous nanowire crossbar system; clock-free nanowire crossbar architecture; logic function reconfiguration; manufacturability enhancement; nanowire crossbar-based configurable digital circuit; nondeterministic nanoscale assembly; post-configuration defect-prone ON-state programming crosspoint; post-configuration repair strategy; row-column utilization; timing-related failure mode; Circuit faults; Clocks; Computer architecture; Logic gates; Maintenance engineering; Testing; Timing; Asynchronous nanowire crossbar architecture; Defect & fault-tolerance; Functional testing; Post-configuration repair; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
  • Conference_Location
    Boise, ID
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4673-2526-4
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2012.6291985
  • Filename
    6291985