Title :
Fabrication of nc-Si:H n-i-p single-junction solar cells using VHF PECVD at a deposition rate of 10 Ã\x85/s
Author :
Cao, Xinmin ; Du, Wenhui ; Yang, Xiesen ; Deng, Xunming
Author_Institution :
Dept. of Phys. & Astron., Toledo Univ., OH
Abstract :
Efforts on the fabrication and optimization of hydrogenated nanocrystalline silicon (nc-Si:H) solar cells using VHP PECVD technique in our UT multi-chamber load-locked PECVD deposition system at a high deposition rate of 10 Aring/s are reported in this paper. nc-Si:H n-i-p single-junction solar cells with initial active-area (0.25 cm2) efficiencies of about 6.6% have been obtained with an i-layer deposition time of 25 min corresponding to a thickness of about 1500 nm and an short circuit current density Jsc of about 21 mA/cm2. The deposition conditions for n-layer and p-layer have also been optimized for the VHP nc-Si:H nip solar cells. With these optimizations, the best FF value of the VHP nc-Si:H single-junction solar cells was reached at 70.9% with an initial efficiency of eta=6.56%. The QE curve shows that the as-deposited nc-Si:H cell has a good spectral response in the long wavelength range and yields an AM1.5G integrated current density Jsc of 8.38 mA/cm2 over the wavelength region from 650 nm to 1000 nm, which is a good candidate as bottom component cell in a-Si:H/a-Si:H/nc-Si:H triple-junction solar cell
Keywords :
elemental semiconductors; hydrogen; nanostructured materials; nanotechnology; plasma CVD; semiconductor junctions; short-circuit currents; silicon; solar cells; 25 min; 650 to 1000 nm; Si:H; Si:H-Si:H-Si:H; UT multichamber load-locked PECVD deposition; VHF PECVD; hydrogenated nanocrystalline silicon solar cells; n-i-p single-junction solar cells; short circuit current density; triple-junction solar cell; Absorption; Fabrication; Hydrogen; Mass production; Photovoltaic cells; Plasma density; Semiconductor thin films; Short circuit currents; Silicon; VHF circuits;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279754