A tool to generate models based on behavioral IBIS models

Author

Deepaksubramanyan, B.S. ; Chen, C. Y Roger ; Nunez, Adrian

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Syracuse Univ., Syracuse, NY, USA

fYear

2012

fDate

5-8 Aug. 2012

Firstpage

234

Lastpage

237

Abstract

Input/Output Buffer Information Specification (IBIS) behavioral models are widely used for circuit-level signal integrity (SI) analysis due to its fast simulation speed and good accuracy. This work presents a tool to generate models of circuits specified by IBIS models. The model generation tool estimates poles, rise time and fall time of a circuit specified by IBIS models. The method consists of two steps; first regression analysis is performed on IBIS data with Weibull distribution function (WCDF) as the regression function. Based on the estimated parameter values, rise time and fall time values are obtained. The second step involves matching moments of WCDF to circuit moments and obtaining the estimated poles of the system. The method is generic and is scalable in nanometer CMOS. CMOS inverters have been used to demonstrate the methodology.

Keywords

CMOS integrated circuits; Weibull distribution; integrated circuit modelling; nanoelectronics; regression analysis; CMOS inverters; IBIS behavioral models; Weibull distribution function; behavioral IBIS models; circuit moments; circuit-level signal integrity analysis; input/output buffer information specification; matching moments; model generation tool; nanometer CMOS; regression analysis; regression function; Approximation methods; Computational modeling; Data models; Delay; Equations; Integrated circuit modeling; Mathematical model;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on

Conference_Location

Boise, ID

ISSN

1548-3746

Print_ISBN

978-1-4673-2526-4

Electronic_ISBN

1548-3746

Type

conf

DOI

10.1109/MWSCAS.2012.6292000

Filename

6292000