• DocumentCode
    3204099
  • Title

    CLEAN technique in strip-map SAR for high-quality imaging

  • Author

    Ghaemi, Hirad ; Galletti, Michele ; Boerner, Thomas ; Gekat, Frank ; Viberg, Mats

  • Author_Institution
    SELEX Sist. Integrati GmbH, Neuss
  • fYear
    2009
  • fDate
    7-14 March 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    The maximum obtainable resolution of a strip-map synthetic aperture radar (SAR) system can be retained by simply avoiding weighting, or tapering, data samples in the along-track compression process. However, this will lead to hazardous artifacts caused by strong sidelobes of the corresponding adjacent scatterers whose interference might severely weaken the desired targets or even introduce false targets. On the other hand, some residual artifacts, even after tapering process, may still deteriorate the quality (contrast) of the SAR image. These issues can be remedied by applying the so-called CLEAN technique, which can mitigate these ill-effects in strip-map SAR imagery while maintaining the maximum resolution. This, indeed, is carried out as a post processing step, i.e., after the azimuth compression is accomplished, in the SAR system. The objective of this paper is to extend the CLEAN technique to strip-map SAR system to produce high-quality images with a very good along-track resolution. The algorithm is then applied to data from a ground-based circular SAR (CSAR) system to verify its implementation as well as this new application of the CLEAN technique.
  • Keywords
    image processing; radar signal processing; synthetic aperture radar; CLEAN technique; ground-based circular SAR; hazardous artifacts; high-quality imaging; signal processing; strip-map SAR imagery; strip-map synthetic aperture radar; Azimuth; Degradation; Feature extraction; Image resolution; Interference; Phased arrays; Radar scattering; Signal processing; Signal resolution; Synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace conference, 2009 IEEE
  • Conference_Location
    Big Sky, MT
  • Print_ISBN
    978-1-4244-2621-8
  • Electronic_ISBN
    978-1-4244-2622-5
  • Type

    conf

  • DOI
    10.1109/AERO.2009.4839474
  • Filename
    4839474