Title :
Empirical model for the transconductance-current dependence of short-channel MOSFETs
Author :
Prodanov, Vladimir I.
Author_Institution :
Electr. Eng. Dept., Cal Poly, San Luis Obispo, CA, USA
Abstract :
This work is concerned with the gm-I dependence of sub-micrometer MOSFETs. The transconductance-current expression given by the Advanced Compact Model (ACM) is reviewed and simple modification is proposed. The modification yields an expression which (with proper parametrization) captures the gm-I dependence of short-channel MOSFETs. The proposed expression is “universal” in the sense that it is capable of modeling the gm-I dependence of long-channel MOSFETs, short-channel MOSFETs, and resistively-degenerated BJTs.
Keywords :
MOSFET; bipolar transistors; ACM; advanced compact model; empirical model; gm-I dependence; long-channel MOSFET; resistively-degenerated BJT; short-channel MOSFET; submicrometer MOSFET; transconductance-current dependence; Analog circuits; Integrated circuit modeling; MOSFETs; Mathematical model; Semiconductor device modeling; Transconductance;
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2012.6292014