DocumentCode :
3204319
Title :
Empirical model for the transconductance-current dependence of short-channel MOSFETs
Author :
Prodanov, Vladimir I.
Author_Institution :
Electr. Eng. Dept., Cal Poly, San Luis Obispo, CA, USA
fYear :
2012
fDate :
5-8 Aug. 2012
Firstpage :
290
Lastpage :
293
Abstract :
This work is concerned with the gm-I dependence of sub-micrometer MOSFETs. The transconductance-current expression given by the Advanced Compact Model (ACM) is reviewed and simple modification is proposed. The modification yields an expression which (with proper parametrization) captures the gm-I dependence of short-channel MOSFETs. The proposed expression is “universal” in the sense that it is capable of modeling the gm-I dependence of long-channel MOSFETs, short-channel MOSFETs, and resistively-degenerated BJTs.
Keywords :
MOSFET; bipolar transistors; ACM; advanced compact model; empirical model; gm-I dependence; long-channel MOSFET; resistively-degenerated BJT; short-channel MOSFET; submicrometer MOSFET; transconductance-current dependence; Analog circuits; Integrated circuit modeling; MOSFETs; Mathematical model; Semiconductor device modeling; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2012 IEEE 55th International Midwest Symposium on
Conference_Location :
Boise, ID
ISSN :
1548-3746
Print_ISBN :
978-1-4673-2526-4
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2012.6292014
Filename :
6292014
Link To Document :
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