Measurement uncertainty analysis of photovoltaic cell short-circuit current at standard test condition

Short-circuit current of crystalline silicon photovoltaic (PV) cell is a central parameter to reflect the cell´s electrical performance. Main influence factors of PV cell´s short-circuit current test were discussed in this paper, where experiments and large data analysis were also carried on. The measurement uncertainty of short-circuit current at standard test condition was studied, and the uncertainty component of each influence factor was calculated to get the compound uncertainty. Then the final expanded uncertainty of short-circuit current test was obtained. According to the computed result, factors with greater influence could be found out, so that relevant adjustment could be made to get a more exact measuring result which can reflect the cell´s electrical performance in an even better fashion and improve the testing quality.