• DocumentCode
    3205262
  • Title

    Inline Diagnostic Systems for the Characterization of Multi-Junction Solar Cells

  • Author

    Ellison, Tim ; Dodge, David ; Karn, Jeff ; Kopf, Rob ; Liu, Rujiang ; Lycette, Mark ; Messing, Wayne

  • Author_Institution
    Energy Conversion Devices Inc., Troy, MI
  • Volume
    2
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    1736
  • Lastpage
    1739
  • Abstract
    Energy Conversion Devices, Inc. (ECD) has developed a comprehensive set of in-line diagnostic systems that allow real-time measurement of the film physical properties and the PV device electrical characteristics in-situ during the PV deposition process. These systems reduce the delay between deposition and characterization by a couple of orders of magnitude, from 1-2 weeks to 1-2 hours, and consequently make possible a new paradigm for QA/QC, optimization, and commissioning new equipment. With a few years of operational experience we now see the possibility of installing devices that can expedite the commissioning process and provide precise characterization for the lifetime of the machine with no calibration or maintenance (with the exception of dusting optical windows every few months). In this paper we review the motivation for these systems, the present status, and our plans for the future
  • Keywords
    commissioning; optical windows; optimisation; production equipment; quality control; reliability; solar cells; thin films; 1 hour to 2 hours; 1 week to 2 weeks; PV deposition process; PV device electrical characteristics; QA-QC; commissioning process; film physical properties; in-line diagnostic systems; machine lifetime; multijunction solar cells; optical windows; optimization; real-time measurement; Calibration; Delay systems; Electric variables; Electric variables measurement; Energy conversion; Energy measurement; Optical devices; Optical films; Photovoltaic cells; Real time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279827
  • Filename
    4059993