Thin-Film Photovoltaic Proton and Electron Radiation Testing for a Meo Orbit

Author

Granata, J.E. ; Sahlstrom, T.D. ; Hausgen, Paul ; Messenger, S.R. ; Walters, R.J. ; Lorentzen, J.R. ; Liu, Simon ; Helizon, Roger

Author_Institution

Aerosp. Corp., Albuquerque, NM

Volume

2

fYear

2006

fDate

38838

Firstpage

1773

Lastpage

1776

Abstract

A radiation test plan for thin-film photovoltaic technologies focused on a MEO flight experiment is outlined. The proton and electron radiation response of thin film, amorphous Si solar cells and CuInGaSe ₂ solar cells, with and without space coatings, is presented. The degradation of the photovoltaic output under penetrating and junction-damaging proton irradiation, and 0.6 MeV and 1 MeV electron irradiation, is measured and examined. The experimental data are presented and analyzed. These data will form the basis for an on-orbit prediction model as applied to a high-radiation MEO orbit

Keywords

amorphous semiconductors; copper compounds; electron beam effects; elemental semiconductors; gallium compounds; indium compounds; proton effects; semiconductor device testing; semiconductor thin films; silicon; solar cells; space power generation; ternary semiconductors; 0.6 MeV; 1 MeV; CuInGaSe₂; MEO flight experiment; Si; amorphous silicon solar cells; high-radiation MEO orbit; junction-damaging proton irradiation; on-orbit prediction model; photovoltaic output; space coatings; thin film silicon solar cells; thin-film photovoltaic electron radiation testing; thin-film photovoltaic proton radiation testing; Amorphous materials; Electrons; Photovoltaic cells; Photovoltaic systems; Protons; Semiconductor thin films; Solar power generation; Space technology; Testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on

Conference_Location

Waikoloa, HI

Print_ISBN

1-4244-0017-1

Electronic_ISBN

1-4244-0017-1

Type

conf

DOI

10.1109/WCPEC.2006.279834

Filename

4060000