Title :
Optimal nonlinear pattern restoration from noisy binary figures
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Abstract :
A mathematical framework for the solution of statistical inference problems on a class of random sets is proposed. It is based on a new definition of expected pattern. The least-mean-difference estimator (restoration filter) is proved, under certain conditions, to be equivalent to the minimization of the measure of size (area) of the set-difference between the original pattern and the expected pattern of the estimated (restored) pattern. Consequently, it is proved that, under certain conditions, if the estimator (restoration filter) is unbiased, then it is the least mean difference estimator (restoration filter)
Keywords :
image processing; mathematical morphology; pattern recognition; least mean difference estimator; least-mean-difference estimator; mathematical framework; noisy binary figures; optimal nonlinear pattern restoration; random sets; restoration filter; statistical inference problems; Area measurement; Filters; Image restoration; Laboratories; Morphology; Noise figure; Pattern analysis; Set theory; Signal restoration; Size measurement;
Conference_Titel :
Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Conference_Location :
Champaign, IL
Print_ISBN :
0-8186-2855-3
DOI :
10.1109/CVPR.1992.223132